Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/655354
Title: Intensity-tunable guided mode resonance reflectance filter with dual channels
Authors: Ye Li;Qi Wang;Dawei Zhang;Jianyu Wang;Peng Chen;Bo Dai;Yuanshen Huang;Chunxian Tao;Bin Sheng
subject: wavelength 747.3 nm|structural parameters|dual resonant wavelength channels|wavelength 786.5 nm|electric field distributions|azimuthal angles|spectral reflectance|optical fabrication|guided mode resonance|rigorous coupled-wave analysis|dual channels|unetched grating|intensity-tunable guided mode resonance reflectance filter
Year: 2016
Publisher: IEEE
Abstract: An intensity-tunable reflectance filter with an unetched grating that is based on guided mode resonance is proposed. The unetched grating is designed for simplifying the fabrication proceeds and avoiding the errors of etching. The dual resonant wavelength channels are calculated by rigorous coupled-wave analysis to be at 747.3 and 786.5 nm. Theoretical and experimental data indicate that the intensity of the spectral reflectance at the peak wavelength of 747.3 nm increases monotonically with variation of the azimuthal angle from 0° to 90°. Conversely, the intensity of the spectral reflectance decreases monotonically under the same conditions at the resonant wavelength of 786.5 nm. It is found experimentally that the intensity can be tuned via the azimuthal angles, and this agrees well with the results of the theoretical analysis. In addition, the influence of the structural parameters on the value of the wavelength separation between the dual resonance channels is analysed, and the electric field distributions at the resonant wavelengths are presented.
Description: 
URI: http://localhost/handle/Hannan/142725
http://localhost/handle/Hannan/655354
ISSN: 1750-0443
volume: 11
issue: 2
Appears in Collections:2016

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Title: Intensity-tunable guided mode resonance reflectance filter with dual channels
Authors: Ye Li;Qi Wang;Dawei Zhang;Jianyu Wang;Peng Chen;Bo Dai;Yuanshen Huang;Chunxian Tao;Bin Sheng
subject: wavelength 747.3 nm|structural parameters|dual resonant wavelength channels|wavelength 786.5 nm|electric field distributions|azimuthal angles|spectral reflectance|optical fabrication|guided mode resonance|rigorous coupled-wave analysis|dual channels|unetched grating|intensity-tunable guided mode resonance reflectance filter
Year: 2016
Publisher: IEEE
Abstract: An intensity-tunable reflectance filter with an unetched grating that is based on guided mode resonance is proposed. The unetched grating is designed for simplifying the fabrication proceeds and avoiding the errors of etching. The dual resonant wavelength channels are calculated by rigorous coupled-wave analysis to be at 747.3 and 786.5 nm. Theoretical and experimental data indicate that the intensity of the spectral reflectance at the peak wavelength of 747.3 nm increases monotonically with variation of the azimuthal angle from 0° to 90°. Conversely, the intensity of the spectral reflectance decreases monotonically under the same conditions at the resonant wavelength of 786.5 nm. It is found experimentally that the intensity can be tuned via the azimuthal angles, and this agrees well with the results of the theoretical analysis. In addition, the influence of the structural parameters on the value of the wavelength separation between the dual resonance channels is analysed, and the electric field distributions at the resonant wavelengths are presented.
Description: 
URI: http://localhost/handle/Hannan/142725
http://localhost/handle/Hannan/655354
ISSN: 1750-0443
volume: 11
issue: 2
Appears in Collections:2016

Files in This Item:
File Description SizeFormat 
7414611.pdf505.35 kBAdobe PDFThumbnail
Preview File
Title: Intensity-tunable guided mode resonance reflectance filter with dual channels
Authors: Ye Li;Qi Wang;Dawei Zhang;Jianyu Wang;Peng Chen;Bo Dai;Yuanshen Huang;Chunxian Tao;Bin Sheng
subject: wavelength 747.3 nm|structural parameters|dual resonant wavelength channels|wavelength 786.5 nm|electric field distributions|azimuthal angles|spectral reflectance|optical fabrication|guided mode resonance|rigorous coupled-wave analysis|dual channels|unetched grating|intensity-tunable guided mode resonance reflectance filter
Year: 2016
Publisher: IEEE
Abstract: An intensity-tunable reflectance filter with an unetched grating that is based on guided mode resonance is proposed. The unetched grating is designed for simplifying the fabrication proceeds and avoiding the errors of etching. The dual resonant wavelength channels are calculated by rigorous coupled-wave analysis to be at 747.3 and 786.5 nm. Theoretical and experimental data indicate that the intensity of the spectral reflectance at the peak wavelength of 747.3 nm increases monotonically with variation of the azimuthal angle from 0° to 90°. Conversely, the intensity of the spectral reflectance decreases monotonically under the same conditions at the resonant wavelength of 786.5 nm. It is found experimentally that the intensity can be tuned via the azimuthal angles, and this agrees well with the results of the theoretical analysis. In addition, the influence of the structural parameters on the value of the wavelength separation between the dual resonance channels is analysed, and the electric field distributions at the resonant wavelengths are presented.
Description: 
URI: http://localhost/handle/Hannan/142725
http://localhost/handle/Hannan/655354
ISSN: 1750-0443
volume: 11
issue: 2
Appears in Collections:2016

Files in This Item:
File Description SizeFormat 
7414611.pdf505.35 kBAdobe PDFThumbnail
Preview File