Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/644279
Title: Study on Optical Properties of Micro-Modulator Through Z Scanning Method
Authors: X. B. Jiao;S. Xue;Y. F. Shen;M. Y. Chen;Z. W. Liu
subject: Optical and other properties|Light-material interactions|Sensors
Year: 2016
Publisher: IEEE
Abstract: Stokes polarimeters and scanning slit optical beam profilers are used to measure the polarization properties and optical spot intensities of a laser beam, which go through the micromodulator by the Z-scanning method. The polarization properties of a S-polarized and a P-polarized light are researched. The optical intensities of laser beam are obtained for S-polarized light by the Z-scanning method. The results show that the groove films can affect the polarization properties of the P-polarized light but do not change the polarization properties of the S-polarized light. The optical spot intensity of S-polarized light can be changed with the help of groove films as the scattering effect.
Description: 
URI: http://localhost/handle/Hannan/185143
http://localhost/handle/Hannan/644279
ISSN: 1943-0655
volume: 8
issue: 3
Appears in Collections:2016

Files in This Item:
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Title: Study on Optical Properties of Micro-Modulator Through Z Scanning Method
Authors: X. B. Jiao;S. Xue;Y. F. Shen;M. Y. Chen;Z. W. Liu
subject: Optical and other properties|Light-material interactions|Sensors
Year: 2016
Publisher: IEEE
Abstract: Stokes polarimeters and scanning slit optical beam profilers are used to measure the polarization properties and optical spot intensities of a laser beam, which go through the micromodulator by the Z-scanning method. The polarization properties of a S-polarized and a P-polarized light are researched. The optical intensities of laser beam are obtained for S-polarized light by the Z-scanning method. The results show that the groove films can affect the polarization properties of the P-polarized light but do not change the polarization properties of the S-polarized light. The optical spot intensity of S-polarized light can be changed with the help of groove films as the scattering effect.
Description: 
URI: http://localhost/handle/Hannan/185143
http://localhost/handle/Hannan/644279
ISSN: 1943-0655
volume: 8
issue: 3
Appears in Collections:2016

Files in This Item:
File Description SizeFormat 
7458127.pdf1.1 MBAdobe PDFThumbnail
Preview File
Title: Study on Optical Properties of Micro-Modulator Through Z Scanning Method
Authors: X. B. Jiao;S. Xue;Y. F. Shen;M. Y. Chen;Z. W. Liu
subject: Optical and other properties|Light-material interactions|Sensors
Year: 2016
Publisher: IEEE
Abstract: Stokes polarimeters and scanning slit optical beam profilers are used to measure the polarization properties and optical spot intensities of a laser beam, which go through the micromodulator by the Z-scanning method. The polarization properties of a S-polarized and a P-polarized light are researched. The optical intensities of laser beam are obtained for S-polarized light by the Z-scanning method. The results show that the groove films can affect the polarization properties of the P-polarized light but do not change the polarization properties of the S-polarized light. The optical spot intensity of S-polarized light can be changed with the help of groove films as the scattering effect.
Description: 
URI: http://localhost/handle/Hannan/185143
http://localhost/handle/Hannan/644279
ISSN: 1943-0655
volume: 8
issue: 3
Appears in Collections:2016

Files in This Item:
File Description SizeFormat 
7458127.pdf1.1 MBAdobe PDFThumbnail
Preview File