Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/476186
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dc.contributor.authorZhao, Huanen_US
dc.contributor.authorTang, Aik Yeanen_US
dc.contributor.authorSobis, Peteren_US
dc.contributor.authorBryllert, Tomasen_US
dc.contributor.authorYhland, Klasen_US
dc.contributor.authorStenarson, Jörgenen_US
dc.contributor.authorStake, Janen_US
dc.date.accessioned2020-05-19T12:14:04Z-
dc.date.available2020-05-19T12:14:04Z-
dc.date.issued2011en_US
dc.identifier.issn9781424466573en_US
dc.identifier.other10.1109/LMWC.2010.2097244en_US
dc.identifier.urihttp://localhost/handle/Hannan/295575en_US
dc.identifier.urihttp://localhost/handle/Hannan/476186-
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.relation.haspartAL1932280.pdfen_US
dc.subjectCalibrationen_US
dc.subjectTHz circuitsen_US
dc.subjectmembranesen_US
dc.subjectmonolithic integrated circuitsen_US
dc.subjectscattering parameter measurementsen_US
dc.subjectsubmillimeter wave measurementsen_US
dc.titleSubmillimeter wave S-parameter characterization of integrated membrane circuitsen_US
dc.typeArticleen_US
dc.typeArticleen_US
dc.journal.titleIEEE Microwave and Wireless Components Lettersen_US
Appears in Collections:2011

Files in This Item:
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AL1932280.pdf333.19 kBAdobe PDF
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZhao, Huanen_US
dc.contributor.authorTang, Aik Yeanen_US
dc.contributor.authorSobis, Peteren_US
dc.contributor.authorBryllert, Tomasen_US
dc.contributor.authorYhland, Klasen_US
dc.contributor.authorStenarson, Jörgenen_US
dc.contributor.authorStake, Janen_US
dc.date.accessioned2020-05-19T12:14:04Z-
dc.date.available2020-05-19T12:14:04Z-
dc.date.issued2011en_US
dc.identifier.issn9781424466573en_US
dc.identifier.other10.1109/LMWC.2010.2097244en_US
dc.identifier.urihttp://localhost/handle/Hannan/295575en_US
dc.identifier.urihttp://localhost/handle/Hannan/476186-
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.relation.haspartAL1932280.pdfen_US
dc.subjectCalibrationen_US
dc.subjectTHz circuitsen_US
dc.subjectmembranesen_US
dc.subjectmonolithic integrated circuitsen_US
dc.subjectscattering parameter measurementsen_US
dc.subjectsubmillimeter wave measurementsen_US
dc.titleSubmillimeter wave S-parameter characterization of integrated membrane circuitsen_US
dc.typeArticleen_US
dc.typeArticleen_US
dc.journal.titleIEEE Microwave and Wireless Components Lettersen_US
Appears in Collections:2011

Files in This Item:
File SizeFormat 
AL1932280.pdf333.19 kBAdobe PDF
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZhao, Huanen_US
dc.contributor.authorTang, Aik Yeanen_US
dc.contributor.authorSobis, Peteren_US
dc.contributor.authorBryllert, Tomasen_US
dc.contributor.authorYhland, Klasen_US
dc.contributor.authorStenarson, Jörgenen_US
dc.contributor.authorStake, Janen_US
dc.date.accessioned2020-05-19T12:14:04Z-
dc.date.available2020-05-19T12:14:04Z-
dc.date.issued2011en_US
dc.identifier.issn9781424466573en_US
dc.identifier.other10.1109/LMWC.2010.2097244en_US
dc.identifier.urihttp://localhost/handle/Hannan/295575en_US
dc.identifier.urihttp://localhost/handle/Hannan/476186-
dc.descriptionen_US
dc.descriptionen_US
dc.descriptionen_US
dc.relation.haspartAL1932280.pdfen_US
dc.subjectCalibrationen_US
dc.subjectTHz circuitsen_US
dc.subjectmembranesen_US
dc.subjectmonolithic integrated circuitsen_US
dc.subjectscattering parameter measurementsen_US
dc.subjectsubmillimeter wave measurementsen_US
dc.titleSubmillimeter wave S-parameter characterization of integrated membrane circuitsen_US
dc.typeArticleen_US
dc.typeArticleen_US
dc.journal.titleIEEE Microwave and Wireless Components Lettersen_US
Appears in Collections:2011

Files in This Item:
File SizeFormat 
AL1932280.pdf333.19 kBAdobe PDF