Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/232730
Title: Analysis of Single-Event Effects in a Radiation-Hardened Low-Jitter PLL Under Heavy Ion and Pulsed Laser Irradiation
Authors: Zhuojun Chen;Min Lin;Ding Ding;Yunlong Zheng;Zehua Sang;Shichang Zou
Year: 2017
Publisher: IEEE
Abstract: A radiation-hardened low-jitter phase-locked loop (PLL) with a low-mismatch charge pump and a robust voltage-controlled oscillator is designed in a 130 nm PD-SOI process. In order to evaluate the overall response to single-event effects, the accumulated phase jitter has been put forward, which can exclude the inherent noise floor and accumulate all the radiation-induced noise. Then the single-event sensitivity of the proposed PLL is comprehensively analyzed by heavy ion and pulsed laser tests.
URI: http://localhost/handle/Hannan/232730
volume: 64
issue: 1
More Information: 106,
112
Appears in Collections:2017

Files in This Item:
File SizeFormat 
7728119.pdf2.38 MBAdobe PDF
Title: Analysis of Single-Event Effects in a Radiation-Hardened Low-Jitter PLL Under Heavy Ion and Pulsed Laser Irradiation
Authors: Zhuojun Chen;Min Lin;Ding Ding;Yunlong Zheng;Zehua Sang;Shichang Zou
Year: 2017
Publisher: IEEE
Abstract: A radiation-hardened low-jitter phase-locked loop (PLL) with a low-mismatch charge pump and a robust voltage-controlled oscillator is designed in a 130 nm PD-SOI process. In order to evaluate the overall response to single-event effects, the accumulated phase jitter has been put forward, which can exclude the inherent noise floor and accumulate all the radiation-induced noise. Then the single-event sensitivity of the proposed PLL is comprehensively analyzed by heavy ion and pulsed laser tests.
URI: http://localhost/handle/Hannan/232730
volume: 64
issue: 1
More Information: 106,
112
Appears in Collections:2017

Files in This Item:
File SizeFormat 
7728119.pdf2.38 MBAdobe PDF
Title: Analysis of Single-Event Effects in a Radiation-Hardened Low-Jitter PLL Under Heavy Ion and Pulsed Laser Irradiation
Authors: Zhuojun Chen;Min Lin;Ding Ding;Yunlong Zheng;Zehua Sang;Shichang Zou
Year: 2017
Publisher: IEEE
Abstract: A radiation-hardened low-jitter phase-locked loop (PLL) with a low-mismatch charge pump and a robust voltage-controlled oscillator is designed in a 130 nm PD-SOI process. In order to evaluate the overall response to single-event effects, the accumulated phase jitter has been put forward, which can exclude the inherent noise floor and accumulate all the radiation-induced noise. Then the single-event sensitivity of the proposed PLL is comprehensively analyzed by heavy ion and pulsed laser tests.
URI: http://localhost/handle/Hannan/232730
volume: 64
issue: 1
More Information: 106,
112
Appears in Collections:2017

Files in This Item:
File SizeFormat 
7728119.pdf2.38 MBAdobe PDF