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Title: | Monolithic Fabrication of InGaAs/GaAs/AlGaAs Multiple Wavelength Quantum Well Laser Diodes via Impurity-Free Vacancy Disordering Quantum Well Intermixing |
Authors: | Zhongliang Qiao;Xiaohong Tang;Xiang Li;Baoxue Bo;Xin Gao;Yi Qu;Chongyang Liu;Hong Wang |
Year: | 2017 |
Publisher: | IEEE |
Abstract: | InGaAs/GaAs/AlGaAs multiple wavelength quantum well (QW) semiconductor laser diodes (LDs) have been fabricated by impurity-free vacancy disordering (IFVD) QW intermixing (QWI) method. The IFVD-QWI process was carried out by sputtering-depositing SiO<sub>2</sub> mask layers on top of the complete InGaAs/GaAs/AlGaAs QW laser structure, emitting at 980 nm wavelength, and followed by a rapid thermal annealing at 880 &x00B0;C for 60 s. The lasing wavelength of the devices fabricated from the intermixed wafer was blue-shifted with the increase of the mask layer thickness. The maximum emission wavelength blue shift of a processed as-cleaved laser reached 112 nm with the output-power more than 1000 mW. By using such an IFVD-QWI technique, multi-wavelength integrated LDs have also been successfully fabricated from a single chip. |
URI: | http://localhost/handle/Hannan/194907 |
volume: | 5 |
issue: | 2 |
More Information: | 122, 127 |
Appears in Collections: | 2017 |
Files in This Item:
File | Size | Format | |
---|---|---|---|
7849181.pdf | 1.05 MB | Adobe PDF |
Title: | Monolithic Fabrication of InGaAs/GaAs/AlGaAs Multiple Wavelength Quantum Well Laser Diodes via Impurity-Free Vacancy Disordering Quantum Well Intermixing |
Authors: | Zhongliang Qiao;Xiaohong Tang;Xiang Li;Baoxue Bo;Xin Gao;Yi Qu;Chongyang Liu;Hong Wang |
Year: | 2017 |
Publisher: | IEEE |
Abstract: | InGaAs/GaAs/AlGaAs multiple wavelength quantum well (QW) semiconductor laser diodes (LDs) have been fabricated by impurity-free vacancy disordering (IFVD) QW intermixing (QWI) method. The IFVD-QWI process was carried out by sputtering-depositing SiO<sub>2</sub> mask layers on top of the complete InGaAs/GaAs/AlGaAs QW laser structure, emitting at 980 nm wavelength, and followed by a rapid thermal annealing at 880 &x00B0;C for 60 s. The lasing wavelength of the devices fabricated from the intermixed wafer was blue-shifted with the increase of the mask layer thickness. The maximum emission wavelength blue shift of a processed as-cleaved laser reached 112 nm with the output-power more than 1000 mW. By using such an IFVD-QWI technique, multi-wavelength integrated LDs have also been successfully fabricated from a single chip. |
URI: | http://localhost/handle/Hannan/194907 |
volume: | 5 |
issue: | 2 |
More Information: | 122, 127 |
Appears in Collections: | 2017 |
Files in This Item:
File | Size | Format | |
---|---|---|---|
7849181.pdf | 1.05 MB | Adobe PDF |
Title: | Monolithic Fabrication of InGaAs/GaAs/AlGaAs Multiple Wavelength Quantum Well Laser Diodes via Impurity-Free Vacancy Disordering Quantum Well Intermixing |
Authors: | Zhongliang Qiao;Xiaohong Tang;Xiang Li;Baoxue Bo;Xin Gao;Yi Qu;Chongyang Liu;Hong Wang |
Year: | 2017 |
Publisher: | IEEE |
Abstract: | InGaAs/GaAs/AlGaAs multiple wavelength quantum well (QW) semiconductor laser diodes (LDs) have been fabricated by impurity-free vacancy disordering (IFVD) QW intermixing (QWI) method. The IFVD-QWI process was carried out by sputtering-depositing SiO<sub>2</sub> mask layers on top of the complete InGaAs/GaAs/AlGaAs QW laser structure, emitting at 980 nm wavelength, and followed by a rapid thermal annealing at 880 &x00B0;C for 60 s. The lasing wavelength of the devices fabricated from the intermixed wafer was blue-shifted with the increase of the mask layer thickness. The maximum emission wavelength blue shift of a processed as-cleaved laser reached 112 nm with the output-power more than 1000 mW. By using such an IFVD-QWI technique, multi-wavelength integrated LDs have also been successfully fabricated from a single chip. |
URI: | http://localhost/handle/Hannan/194907 |
volume: | 5 |
issue: | 2 |
More Information: | 122, 127 |
Appears in Collections: | 2017 |
Files in This Item:
File | Size | Format | |
---|---|---|---|
7849181.pdf | 1.05 MB | Adobe PDF |