Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/141487
 Title: Voltage Ratio Traceability of 10 kV Low-Voltage Excited Two-Stage Voltage Transformer Authors: Huanghui Zhang;Haiming Shao;Jiafu Wang;Wei Wang;Feipeng Lin;Tianyu Sun;Wei Zhao;Chuansheng Li;Yiqian Wu Year: 2017 Publisher: IEEE Abstract: To establish a series of ppm-level high-voltage ratio standards up to 110 kV, we propose and have designed low-voltage-excitation two-stage voltage transformers (LVE-TSVTs) for high voltage. Ratio traceability for a 10 kV/100 V LVE-TSVT is vital in this scheme. This paper focuses on the voltage ratio traceability of the 10 kV LVE-TSVT by measuring the errors of the reference voltage and the voltage coefficient separately. A 1 kV double-TSVT with a 1 kV/100 V TSVT and a 100 V/10 V TSVT in cascade was developed and calibrated, and then was used to calibrate the error of the 10-kV LVE-TSVT at 10&x0025; rated voltage. The voltage coefficient was measured by comparing with a high-voltage capacitive divider through a current comparator bridge. The measurement was implemented in the range of 10&x0025;&x2013;120&x0025; rated voltage. The calibration results showed that the ratio errors of the 10-kV LVE-TSVT were less than 0.95 \times 10^{-6} in magnitude and -1.26\,\,\mu rad in phase displacement at the 10&x0025; rated voltage. The expanded uncertainties are about 1.8 \times 10^{-6} in ratio and 2.2~\mu rad in phase, respectively, with coverage factor k = 2 . URI: http://localhost/handle/Hannan/141487 volume: 66 issue: 6 More Information: 1405,1410 Appears in Collections: 2017

Files in This Item:
File SizeFormat