Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/119303
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dc.contributor.authorZheng Liuen_US
dc.contributor.authorGaobiao Xiaoen_US
dc.date.accessioned2013en_US
dc.date.accessioned2020-04-06T06:54:11Z-
dc.date.available2020-04-06T06:54:11Z-
dc.date.issued2017en_US
dc.identifier.other10.1109/TCPMT.2016.2626382en_US
dc.identifier.urihttp://localhost/handle/Hannan/119303-
dc.description.abstractIn this paper, a simplified ray tracing method is used to approximately predict the coupling characteristics of H-plane multi-aperture substrate integrated waveguide (SIW) couplers. The output powers of the output ports are calculated with the reflection and the transmission coefficients at the coupling windows. The ray tracing method provides a simple and efficient way to determine the initial values for the geometrical parameters of SIW-based multi-aperture couplers. From these initial values, the structures of the couplers can be quickly optimized with less iterations, so that the design efficiency can be greatly improved. In order to get high isolation, a criterion is introduced to prevent exciting higher order propagating Floquet modes in the SIWs. Three examples of multi-aperture couplers are designed with our approach. The measured results agree well with the simulated results and the ones predicted using the ray tracing method.en_US
dc.format.extent106,en_US
dc.format.extent113en_US
dc.publisherIEEEen_US
dc.relation.haspart7786915.pdfen_US
dc.titleDesign of SIW-Based Multi-Aperture Couplers Using Ray Tracing Methoden_US
dc.typeArticleen_US
dc.journal.volume7en_US
dc.journal.issue1en_US
Appears in Collections:2017

Files in This Item:
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7786915.pdf2.18 MBAdobe PDF
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZheng Liuen_US
dc.contributor.authorGaobiao Xiaoen_US
dc.date.accessioned2013en_US
dc.date.accessioned2020-04-06T06:54:11Z-
dc.date.available2020-04-06T06:54:11Z-
dc.date.issued2017en_US
dc.identifier.other10.1109/TCPMT.2016.2626382en_US
dc.identifier.urihttp://localhost/handle/Hannan/119303-
dc.description.abstractIn this paper, a simplified ray tracing method is used to approximately predict the coupling characteristics of H-plane multi-aperture substrate integrated waveguide (SIW) couplers. The output powers of the output ports are calculated with the reflection and the transmission coefficients at the coupling windows. The ray tracing method provides a simple and efficient way to determine the initial values for the geometrical parameters of SIW-based multi-aperture couplers. From these initial values, the structures of the couplers can be quickly optimized with less iterations, so that the design efficiency can be greatly improved. In order to get high isolation, a criterion is introduced to prevent exciting higher order propagating Floquet modes in the SIWs. Three examples of multi-aperture couplers are designed with our approach. The measured results agree well with the simulated results and the ones predicted using the ray tracing method.en_US
dc.format.extent106,en_US
dc.format.extent113en_US
dc.publisherIEEEen_US
dc.relation.haspart7786915.pdfen_US
dc.titleDesign of SIW-Based Multi-Aperture Couplers Using Ray Tracing Methoden_US
dc.typeArticleen_US
dc.journal.volume7en_US
dc.journal.issue1en_US
Appears in Collections:2017

Files in This Item:
File SizeFormat 
7786915.pdf2.18 MBAdobe PDF
Full metadata record
DC FieldValueLanguage
dc.contributor.authorZheng Liuen_US
dc.contributor.authorGaobiao Xiaoen_US
dc.date.accessioned2013en_US
dc.date.accessioned2020-04-06T06:54:11Z-
dc.date.available2020-04-06T06:54:11Z-
dc.date.issued2017en_US
dc.identifier.other10.1109/TCPMT.2016.2626382en_US
dc.identifier.urihttp://localhost/handle/Hannan/119303-
dc.description.abstractIn this paper, a simplified ray tracing method is used to approximately predict the coupling characteristics of H-plane multi-aperture substrate integrated waveguide (SIW) couplers. The output powers of the output ports are calculated with the reflection and the transmission coefficients at the coupling windows. The ray tracing method provides a simple and efficient way to determine the initial values for the geometrical parameters of SIW-based multi-aperture couplers. From these initial values, the structures of the couplers can be quickly optimized with less iterations, so that the design efficiency can be greatly improved. In order to get high isolation, a criterion is introduced to prevent exciting higher order propagating Floquet modes in the SIWs. Three examples of multi-aperture couplers are designed with our approach. The measured results agree well with the simulated results and the ones predicted using the ray tracing method.en_US
dc.format.extent106,en_US
dc.format.extent113en_US
dc.publisherIEEEen_US
dc.relation.haspart7786915.pdfen_US
dc.titleDesign of SIW-Based Multi-Aperture Couplers Using Ray Tracing Methoden_US
dc.typeArticleen_US
dc.journal.volume7en_US
dc.journal.issue1en_US
Appears in Collections:2017

Files in This Item:
File SizeFormat 
7786915.pdf2.18 MBAdobe PDF