مرور بر اساس تاریخ انتشار Xingye Zhou
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| Preview | Issue Date | Title | Contributor(s) |
|---|---|---|---|
| 2017 | Reliability Assessment of InAlN/GaN HFETs With Lifetime 8.9\times 10^{\mathrm {6}} h | Yuangang Wang; Yuanjie Lv; Xubo Song; Lei Chi; Jiayun Yin; Xingye Zhou; Yulong Fang; Xin Tan; Hongyu Guo; Hao Peng; Guodong Gu; Zhihong Feng; Shujun Cai |