مرور بر اساس تاریخ انتشار Han-Ping D. Shieh

Showing results 1 to 10 of 10
PreviewIssue DateTitleContributor(s)
7360111.pdf.jpg2016Efficiency Enhancement of Organic Light-Emitting Diodes on Flexible Substrate With Patterned Inverted Conical StructureYi-Jun Wang; Jian-Gang Lu; Han-Ping D. Shieh
7823415.pdf.jpg2016Enhancement of polar phases in PVDF by forming PVDF/SiC nanowire compositeJie-Fang Huang; Song-Jia Han; Hui-Jiuan Chen; Gui-Shi Liu; Gong-Tan Li; Yu-Cheng Wang; Zi-Xin Wang; Bo-Ru Yang; Zhen-Hua Luo; Han-Ping D. Shieh
2017Evaluation of a Transparent Display's Pixel Structure Regarding Subjective Quality of Diffracted See-Through ImagesZong Qin; Jing Xie; Fang-Cheng Lin; Yi-Pai Huang; Han-Ping D. Shieh
7590104.pdf.jpg2016Influences of Nitrogen Doping on the Electrical Characteristics of Indium-Zinc-Oxide Thin Film TransistorsYanbing Han; Hai Yan; Yun-Chu Tsai; Yan Li; Qun Zhang; Han-Ping D. Shieh
2017Integrating Poly-Silicon and InGaZnO Thin-Film Transistors for CMOS InvertersChangDong Chen; Bo-Ru Yang; Chuan Liu; Xing-Yu Zhou; Yuan-Jun Hsu; Yuan-Chun Wu; Jang-Soon lm; Po-Yen Lu; Man Wong; Hoi-Sing Kwok; Han-Ping D. Shieh
2017Maximal Acceptable Ghost Images for Designing a Legible Windshield-Type Vehicle Head-Up DisplayZong Qin; Fang-Cheng Lin; Yi-Pai Huang; Han-Ping D. Shieh
7442811.pdf.jpg2016Nitrogen-Doped Amorphous InZnSnO Thin Film Transistors With a Tandem Structure for High-Mobility and Reliable OperationsGongTan Li; Bo-Ru Yang; Chuan Liu; Chia-Yu Lee; Yuan-Chun Wu; Po-Yen Lu; ShaoZhi Deng; Han-Ping D. Shieh; NingSheng Xu
7416615.pdf.jpg2016Photoluminescence and Reliability Study of ZnO Cosputtered IGZO Thin-Film Transistors Under Various Ambient ConditionsNidhi Tiwari; Ram Narayan Chauhan; Han-Ping D. Shieh; Po-Tsun Liu; Yi-Pai Huang
7403915.pdf.jpg2016Stability of Amorphous Indium&x2013;Tungsten Oxide Thin-Film Transistors Under Various Wavelength Light IlluminationZhao Yang; Ting Meng; Qun Zhang; Han-Ping D. Shieh
7581090.pdf.jpg2016Subgap State Engineering Using Nitrogen Incorporation to Improve Reliability of Amorphous InGaZnO Thin-Film Transistors in Various Stressing ConditionsGongTan Li; RunZe Zhan; Bo-Ru Yang; Chuan Liu; ChengYuan Dong; Chia-Yu Lee; Yuan-Chun Wu; Po-Yen Lu; ShaoZhi Deng; Han-Ping D. Shieh; NingSheng Xu