مرور بر اساس تاریخ انتشار An-Ni Dai
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| Preview | Issue Date | Title | Contributor(s) |
|---|---|---|---|
 | 2016 | The Observation of Width Quantization Impact on Device Performance and Reliability for High-k/Metal Tri-Gate FinFET | Wen-Kuan Yeh; Wenqi Zhang; Yi-Lin Yang; An-Ni Dai; Kehuey Wu; Tung-Huan Chou; Cheng-Li Lin; Kwang-Jow Gan; Chia-Hung Shih; Po-Ying Chen |