Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/58162
Title: Impact of gate material engineering on ED-TFET for improving DC/analogue-RF/linearity performances
Authors: Bandi Venkata Chandan|Sushmitha Dasari|Kaushal Nigam|Shivendra Yadav|Sunil Pandey|Dheeraj Sharma
subject: third-order transconductance coefficient|figure of merits|nanoscale devices|gate electrode|fabrication complexity|gate-to-drain capacitance|p+ source regions|DMG-ED-TFET|gate work-function engineering|gate material engineering|linearity performance metric
Year: 2018
Publisher: IET
URI: http://localhost/handle/Hannan/58162
ISSN: 1750-0443
volume: Volume 13
issue: Issue 12
More Information: 1653
1656
Micro & Nano Letters
Appears in Collections:2018

Files in This Item:
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Title: Impact of gate material engineering on ED-TFET for improving DC/analogue-RF/linearity performances
Authors: Bandi Venkata Chandan|Sushmitha Dasari|Kaushal Nigam|Shivendra Yadav|Sunil Pandey|Dheeraj Sharma
subject: third-order transconductance coefficient|figure of merits|nanoscale devices|gate electrode|fabrication complexity|gate-to-drain capacitance|p+ source regions|DMG-ED-TFET|gate work-function engineering|gate material engineering|linearity performance metric
Year: 2018
Publisher: IET
URI: http://localhost/handle/Hannan/58162
ISSN: 1750-0443
volume: Volume 13
issue: Issue 12
More Information: 1653
1656
Micro & Nano Letters
Appears in Collections:2018

Files in This Item:
File Description SizeFormat 
08571409.pdf511.78 kBAdobe PDFThumbnail
Preview File
Title: Impact of gate material engineering on ED-TFET for improving DC/analogue-RF/linearity performances
Authors: Bandi Venkata Chandan|Sushmitha Dasari|Kaushal Nigam|Shivendra Yadav|Sunil Pandey|Dheeraj Sharma
subject: third-order transconductance coefficient|figure of merits|nanoscale devices|gate electrode|fabrication complexity|gate-to-drain capacitance|p+ source regions|DMG-ED-TFET|gate work-function engineering|gate material engineering|linearity performance metric
Year: 2018
Publisher: IET
URI: http://localhost/handle/Hannan/58162
ISSN: 1750-0443
volume: Volume 13
issue: Issue 12
More Information: 1653
1656
Micro & Nano Letters
Appears in Collections:2018

Files in This Item:
File Description SizeFormat 
08571409.pdf511.78 kBAdobe PDFThumbnail
Preview File