Please use this identifier to cite or link to this item: http://dlib.scu.ac.ir/handle/Hannan/52804
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dc.contributor.authorShaw, Gordon A.en_US
dc.contributor.authorProrok, Barton C.en_US
dc.contributor.authorStarman, LaVern A.en_US
dc.date.accessioned2017-05-22T04:29:17Z-
dc.date.available2017-05-22T04:29:17Z-
dc.date.issued2013en_US
dc.identifier.isbn9781461444367.en_US
dc.identifier.isbn9781461444350 (print)en_US
dc.identifier.urihttp://46.100.53.162/handle/Ebook/52804-
dc.descriptionPrinted edition: 9781461444350.en_US
dc.description.abstractMEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: Devices & Fabrication Measurement Challenges in Single Molecule/Single Atom Mechanical Testing Nanoindentation Size Effects in Metals Optical Methods Reliability, Residual Stress & Tribology.en_US
dc.description.statementofresponsibilityedited by Gordon A. Shaw, Barton C. Prorok, LaVern A. Starman.en_US
dc.description.tableofcontentsFrom the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor -- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches -- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules -- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration -- A Precision Force Microscope for Biophysics -- DNA Molecular Recognition Using AFM Nanometrology -- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy -- New Insight into Pile-Up in Thin Film Indentation.en_US
dc.publisherSpringer New York :.en_US
dc.publisherImprint: Springer,en_US
dc.relation.ispartofseriesConference Proceedings of the Society for Experimental Mechanics Series, 2191-5644.en_US
dc.relation.ispartofseriesConference Proceedings of the Society for Experimental Mechanics Series, 2191-5644.en_US
dc.relation.haspart9781461444367.pdfen_US
dc.subjectEngineeringen_US
dc.subjectMechanics, applied.en_US
dc.subjectNanotechnologyen_US
dc.subjectEngineeringen_US
dc.subjectNanotechnology and Microengineering.en_US
dc.subjectTheoretical and Applied Mechanics.en_US
dc.subjectNanotechnologyen_US
dc.subject.lccT174.7en_US
dc.titleMEMS and Nanotechnology, Volume 6en_US
dc.title.alternativeProceedings of the 2012 Annual Conference on Experimental and Applied Mechanicsen_US
dc.typeBooken_US
dc.publisher.placeNew York, NYen_US
Appears in Collections:کلیات فنی و مهندسی

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Full metadata record
DC FieldValueLanguage
dc.contributor.authorShaw, Gordon A.en_US
dc.contributor.authorProrok, Barton C.en_US
dc.contributor.authorStarman, LaVern A.en_US
dc.date.accessioned2017-05-22T04:29:17Z-
dc.date.available2017-05-22T04:29:17Z-
dc.date.issued2013en_US
dc.identifier.isbn9781461444367.en_US
dc.identifier.isbn9781461444350 (print)en_US
dc.identifier.urihttp://46.100.53.162/handle/Ebook/52804-
dc.descriptionPrinted edition: 9781461444350.en_US
dc.description.abstractMEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: Devices & Fabrication Measurement Challenges in Single Molecule/Single Atom Mechanical Testing Nanoindentation Size Effects in Metals Optical Methods Reliability, Residual Stress & Tribology.en_US
dc.description.statementofresponsibilityedited by Gordon A. Shaw, Barton C. Prorok, LaVern A. Starman.en_US
dc.description.tableofcontentsFrom the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor -- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches -- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules -- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration -- A Precision Force Microscope for Biophysics -- DNA Molecular Recognition Using AFM Nanometrology -- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy -- New Insight into Pile-Up in Thin Film Indentation.en_US
dc.publisherSpringer New York :.en_US
dc.publisherImprint: Springer,en_US
dc.relation.ispartofseriesConference Proceedings of the Society for Experimental Mechanics Series, 2191-5644.en_US
dc.relation.ispartofseriesConference Proceedings of the Society for Experimental Mechanics Series, 2191-5644.en_US
dc.relation.haspart9781461444367.pdfen_US
dc.subjectEngineeringen_US
dc.subjectMechanics, applied.en_US
dc.subjectNanotechnologyen_US
dc.subjectEngineeringen_US
dc.subjectNanotechnology and Microengineering.en_US
dc.subjectTheoretical and Applied Mechanics.en_US
dc.subjectNanotechnologyen_US
dc.subject.lccT174.7en_US
dc.titleMEMS and Nanotechnology, Volume 6en_US
dc.title.alternativeProceedings of the 2012 Annual Conference on Experimental and Applied Mechanicsen_US
dc.typeBooken_US
dc.publisher.placeNew York, NYen_US
Appears in Collections:کلیات فنی و مهندسی

Files in This Item:
File Description SizeFormat 
9781461444367.pdf8.47 MBAdobe PDFThumbnail
Preview File
Full metadata record
DC FieldValueLanguage
dc.contributor.authorShaw, Gordon A.en_US
dc.contributor.authorProrok, Barton C.en_US
dc.contributor.authorStarman, LaVern A.en_US
dc.date.accessioned2017-05-22T04:29:17Z-
dc.date.available2017-05-22T04:29:17Z-
dc.date.issued2013en_US
dc.identifier.isbn9781461444367.en_US
dc.identifier.isbn9781461444350 (print)en_US
dc.identifier.urihttp://46.100.53.162/handle/Ebook/52804-
dc.descriptionPrinted edition: 9781461444350.en_US
dc.description.abstractMEMS and Nanotechnology, Volume 6: Proceedings of the 2012 Annual Conference on Experimental and Applied Mechanics, the sixth volume of seven from the Conference, brings together 23 contributions to this important area of research and engineering. The collection presents early findings and case studies on fundamental and applied aspects of Experimental and Applied Mechanics, including papers on: Devices & Fabrication Measurement Challenges in Single Molecule/Single Atom Mechanical Testing Nanoindentation Size Effects in Metals Optical Methods Reliability, Residual Stress & Tribology.en_US
dc.description.statementofresponsibilityedited by Gordon A. Shaw, Barton C. Prorok, LaVern A. Starman.en_US
dc.description.tableofcontentsFrom the Contents: Silicon Carbide High Temperature MEMS Capacitive Strain Sensor -- Characterizing External Resistive, Inductive and Capacitive Loads for Micro-switches -- KEYNOTE: Principles Involved in Interpreting Single-Molecule Force Measurement of Biomolecules -- KEYNOTE: Measurement of the Gold-Gold Bond Rupture Force at 4 K in a Single-atom Chain Using Photon-momentum-based Force Calibration -- A Precision Force Microscope for Biophysics -- DNA Molecular Recognition Using AFM Nanometrology -- Hydrodynamic Force Compensation for Single-molecule Mechanical Testing Using Colloidal Probe Atomic Force Microscopy -- New Insight into Pile-Up in Thin Film Indentation.en_US
dc.publisherSpringer New York :.en_US
dc.publisherImprint: Springer,en_US
dc.relation.ispartofseriesConference Proceedings of the Society for Experimental Mechanics Series, 2191-5644.en_US
dc.relation.ispartofseriesConference Proceedings of the Society for Experimental Mechanics Series, 2191-5644.en_US
dc.relation.haspart9781461444367.pdfen_US
dc.subjectEngineeringen_US
dc.subjectMechanics, applied.en_US
dc.subjectNanotechnologyen_US
dc.subjectEngineeringen_US
dc.subjectNanotechnology and Microengineering.en_US
dc.subjectTheoretical and Applied Mechanics.en_US
dc.subjectNanotechnologyen_US
dc.subject.lccT174.7en_US
dc.titleMEMS and Nanotechnology, Volume 6en_US
dc.title.alternativeProceedings of the 2012 Annual Conference on Experimental and Applied Mechanicsen_US
dc.typeBooken_US
dc.publisher.placeNew York, NYen_US
Appears in Collections:کلیات فنی و مهندسی

Files in This Item:
File Description SizeFormat 
9781461444367.pdf8.47 MBAdobe PDFThumbnail
Preview File