Please use this identifier to cite or link to this item: http://localhost/handle/Hannan/32557
Title: How test suites impact fault localisation starting from the size
Authors: Yan Lei|Chengnian Sun|Xiaoguang Mao|Zhendong Su
subject: debugging|fault localisation|large-scale empirical analysis|software test suites
Year: 2018
Publisher: IET
URI: http://localhost/handle/Hannan/32557
ISSN: 1751-8806
volume: Volume 12
issue: Issue 3
More Information: 190
205
IET Software
Appears in Collections:2018

Files in This Item:
File Description SizeFormat 
08371742.pdf1.9 MBAdobe PDFThumbnail
Preview File
Title: How test suites impact fault localisation starting from the size
Authors: Yan Lei|Chengnian Sun|Xiaoguang Mao|Zhendong Su
subject: debugging|fault localisation|large-scale empirical analysis|software test suites
Year: 2018
Publisher: IET
URI: http://localhost/handle/Hannan/32557
ISSN: 1751-8806
volume: Volume 12
issue: Issue 3
More Information: 190
205
IET Software
Appears in Collections:2018

Files in This Item:
File Description SizeFormat 
08371742.pdf1.9 MBAdobe PDFThumbnail
Preview File
Title: How test suites impact fault localisation starting from the size
Authors: Yan Lei|Chengnian Sun|Xiaoguang Mao|Zhendong Su
subject: debugging|fault localisation|large-scale empirical analysis|software test suites
Year: 2018
Publisher: IET
URI: http://localhost/handle/Hannan/32557
ISSN: 1751-8806
volume: Volume 12
issue: Issue 3
More Information: 190
205
IET Software
Appears in Collections:2018

Files in This Item:
File Description SizeFormat 
08371742.pdf1.9 MBAdobe PDFThumbnail
Preview File