مرور بر اساس تاریخ انتشار Qi Guo

Showing results 1 to 13 of 13
PreviewIssue DateTitleContributor(s)
7275143.pdf.jpg2016Accelerating Architectural Simulation Via Statistical Techniques: A SurveyQi Guo; Tianshi Chen; Yunji Chen; Franz Franchetti
2017An Accelerator for High Efficient Vision ProcessingZidong Du; Shaoli Liu; Robert Fasthuber; Tianshi Chen; Paolo Ienne; Ling Li; Tao Luo; Qi Guo; Xiaobing Feng; Yunji Chen; Olivier Temam
2017Antenna Deembedding for mmWave Propagation Modeling and Field Measurement Validation at 73 GHzRuonan Zhang; Yuliang Zhou; Xiaofeng Lu; Chang Cao; Qi Guo
2017Automating Characterization Deployment in Distributed Data Stream Management SystemsChunkai Wang; Xiaofeng Meng; Qi Guo; Zujian Weng; Chen Yang
7496977.pdf.jpg2016Characteristics Comparison Between HTS Air Core and Partial Core TransformersDaoyu Hu; Jie Sheng; Zhuyong Li; Zhibin Jing; Qi Guo; Zhiyong Hong; Zhijian Jin; K. Ryu; H. S. Yang
7027199.pdf.jpg2016Evaluation and Tradeoffs for Out-of-Order Execution on Reconfigurable Heterogeneous MPSoCQi Guo; Xi Li; Chao Wang; Xuehai Zhou
2017Greene Approximation Wide-Angle Parabolic Equation for Radio PropagationQi Guo; Ci Zhou; Yunliang Long
7454875.pdf.jpg2016Impact of Bias Conditions on Total Ionizing Dose Effects of ^{60}{\hbox{Co}}\gamma in SiGe HBTJinxin Zhang; Qi Guo; Hongxia Guo; Wu Lu; Chaohui He; Xin Wang; Pei Li; Mohan Liu
2017Impact of Trapezoidal Cross Section on Polarization Sensitivity of SNSPD With Ultranarrow NanowireQi Guo; Lixing You; Hao Li; Weijun Zhang; Lu Zhang; Xiaoyu Liu; Xiaoyan Yang; Sijing Chen; Zhen Wang; Xiaoming Xie
2017An Investigation of ELDRS in Different SiGe ProcessesPei Li; Chaohui He; Hongxia Guo; Qi Guo; Jinxin Zhang; Mohan Liu
2017Pade Second-Order Parabolic Equation Modeling for Propagation Over Irregular TerrainQi Guo; Yunliang Long
7464332.pdf.jpg2016Research of Hydro-Turbine Governor Supplementary Control Strategy for Islanding AC Grid at Sending Terminal of HVDC SystemGuangtao Zhang; Yuanchu Cheng; Na Lu; Qi Guo
2017Total Ionizing Dose Influence on the Single-Event Upset Sensitivity of 130-nm PD SOI SRAMsQiwen Zheng; Jiangwei Cui; Mengxin Liu; Hang Zhou; Mohan Liu; Ying Wei; Dandan Su; Teng Ma; Wu Lu; Xuefeng Yu; Qi Guo; Chengfa He