مرور بر اساس تاریخ انتشار Jingyu Shen
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| Preview | Issue Date | Title | Contributor(s) |
|---|---|---|---|
| 2017 | Assessment of TID Effect of FRAM Memory Cell Under Electron, X-Ray, and Co- 60~\gamma Ray Radiation Sources | Jingyu Shen; Wei Li; Yuanbin Zhang |